[Journal Articles][Conference Papers]

Sean Andersson Professor Assistant Professor ENG 301 Office: (617) 353-4949 Email: sanderss http://people.bu.edu/sanderss/

Biography

RESEARCH INTERESTS:

The Andersson group at Boston University focuses on systems and control theory. We are primarily interested in the application areas of nanotechnology, nanobioscience, and robotics. We believe the potential of scanning probe microscopy has not yet been realized. We are investigating novel methods for rapid imaging of samples and for studying dynamics in systems with nanometer-scale phenomena. By replacing the traditional raster-scan approach to imaging with feedback control laws which drive the sampling scheme, the domain of applicability of scanning probe technologies can be extended deeper into the realm of dynamic processes. Our research on robotics centers on the framework of symbolic control. We aim to develop methods for handling the complexity of robotics in real-world environments. Ongoing work includes the use of symbols to tokenize the environment as well as the control and applications in cooperative control.

Journal Articles

4.) S. Andersson, and T. Sun, "Linear optimal control for tracking a single fluorescent particle in a confocal microscope," Applied Physics B: Lasers and Optics, Vol. 94, No. 3, 2009, pp. 403-409

3.) S. Andersson, "Localization of a fluorescent source without numerical fitting," Optics Express, Vol. 16, No. 23, November 2008, pp. 18714-18724

2.) S. Andersson, "Discretization of a Continuous Curve," IEEE Transactions on Robotics, Vol. 24, No. 2, 2008, pp. 456-461

1.) S. Andersson, "Curve Tracking for Rapid Imaging in AFM," IEEE Transactions on Nanobioscience, Vol. 6, No. 4, December 2007, pp. 354-361

Conference Papers

4.) P. Chang, and S. Andersson, "Smooth trajectories for imaging string-like samples in AFM: A preliminary study," 2008 American Control Conference, 11-13 June 2008

3.) T. Sun, and S. Andersson, "Precise 3-D localization of fluorescent probes without numerical fitting," Proceedings of the 29th Annual International Conference of the IEEE EMBS, August 2007, pp. 4181-4184

2.) S. Andersson, and D. Y. Abramovitch, "A Survey of Non-Raster Scan Methods with Application to Atomic Force Microscopy," Proceedings of the 2007 American Control Conference, 2007, pp. 3516-3521

1.) D. Y. Abramovitch, S. Andersson, L. Y. Pao, and G. Schitter, "A Tutorial on the Mechanisms, Dynamics and Control of Atomic Force Microscopes," Proceedings of the 2007 American Control Conference, 2007, pp. 3488-3502